Defect-enhanced Auger recombination and high-carrier-density phenomena in low-temperature grown GaAs
01.01.1997
296616 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Impact ionization and Auger recombination at high carrier temperature
Online Contents | 2009
|Impact ionization and Auger recombination at high carrier temperature
Online Contents | 2009
|High-Carrier-Density Pump-Probe Measurements of Low-Temperature Grown GaAs
British Library Conference Proceedings | 1997
|Ultrafast Carrier Lifetime in Low-Temperature Grown GaAs, InP and InGaP
British Library Conference Proceedings | 1994
|