The radiation hardness characteristics of nano-electromechanical single-walled carbon nanotube (SWNT) memory elements has been studied. The NRAM bits have been exposed to 100 krad, 1 Mrad and 10 Mrad of gamma-radiation. Initial test results indicate that NRAM is an extremely radiation hard memory.


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    Titel :

    Nanotube memories for space applications


    Beteiligte:
    Lovellette, M.N. (Autor:in) / Campbell, A.B. (Autor:in) / Hughes, H.L. (Autor:in) / Lawerence, R.K. (Autor:in) / Ward, J.W. (Autor:in) / Meinhold, M. (Autor:in) / Bengtson, T.R. (Autor:in) / Carleton, G.F. (Autor:in) / Segal, B.M. (Autor:in) / Rueckes, T. (Autor:in)


    Erscheinungsdatum :

    01.01.2004


    Format / Umfang :

    443648 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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