This paper presents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise to scratches. The physical modelling of the defect along with its classification as region of partially missing data allows very good results both in detection and in restoration.


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    Titel :

    Line scratches detection and restoration via light diffraction


    Beteiligte:
    Bruni, V. (Autor:in) / Vitulano, D. (Autor:in) / Kokaram, A. (Autor:in)


    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    394029 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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