We present a new semi-analytic technique for estimating the diffraction loss and threshold gain of oxide apertured microcavity VCSELs. Apart from a few geometric simplifications, our calculation is based on a rigorous first-principles analysis of the modal fields. By combining the threshold gain with the electronic bandstructure and optical matrix elements, we calculate the threshold currents of microcavity VCSELs and obtain good agreement with experiments.


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    Titel :

    Semi-analytic calculation of diffraction losses and threshold currents in microcavity VCSELs


    Beteiligte:
    Noble, M.J. (Autor:in) / Loehr, J.P. (Autor:in) / Lott, J.A. (Autor:in)


    Erscheinungsdatum :

    01.01.1998


    Format / Umfang :

    143313 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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