We present a new semi-analytic technique for estimating the diffraction loss and threshold gain of oxide apertured microcavity VCSELs. Apart from a few geometric simplifications, our calculation is based on a rigorous first-principles analysis of the modal fields. By combining the threshold gain with the electronic bandstructure and optical matrix elements, we calculate the threshold currents of microcavity VCSELs and obtain good agreement with experiments.
Semi-analytic calculation of diffraction losses and threshold currents in microcavity VCSELs
01.01.1998
143313 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Semi-Analytic Calculation of Diffraction Losses and Threshold Currents in Microcavity VCSELs
British Library Conference Proceedings | 1998
|Low Threshold AlxOy-Confined VCSELs and Densely-Packed Arrays
British Library Conference Proceedings | 1996
|