A two-section technique is used to measure gain spectrum of semiconductor optical amplifiers. Without other external setup, broadband gain spectrum is measured for a spectral range of 290 nm with the gain of above 30 cm/sup -1/.


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    Titel :

    Measurement of broadband gain spectrum of semiconductor optical amplifiers using a two-section technique


    Beteiligte:
    Chao-Hsin Wu, (Autor:in) / Yi-Shin Su, (Autor:in) / Ching-Fuh Lin, (Autor:in)


    Erscheinungsdatum :

    01.01.2004


    Format / Umfang :

    164821 byte



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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