Measured pulse duration and band-gap scaling of the laser breakdown threshold in oxide dielectrics is explained by multiphoton and impact ionization, and relaxation. Formation of self-trapped excitons on a sub-ps time scale is observed.
Scaling laws of femtosecond laser induced breakdown in dielectric films
Conference on Lasers and Electro-Optics, 2004. (CLEO). ; 2 ; 3 pp. vol.2
01.01.2004
125950 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
TIBKAT | 1978
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