A simple solid-state-based approach is used to measure the variation of the carrier-envelope phase in the focus of a lens due to the Gouy phase. The experimental results are compared with analytical model calculations.
Variation of the carrier-envelope phase of few-cycle laser pulses due to the Gouy phase
2005 Quantum Electronics and Laser Science Conference ; 3 ; 1902-1904 vol. 3
01.01.2005
1364090 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch