This paper deals with the development of a measurement procedure to characterize anomalies, i.e. voids and defects, in four composite material (CM) samples. For this aim, four CM samples, each of them characterized by specific manufacturing techniques, have been analyzed. The first one (CM1) has Teflon defects, the second one (CM2) has undergone a low-degree manufacturing process and thus judged too porous at quality control, the third one (CM3) has passed the interlaminar shear strength (ILSS) test and so is expected to have a low-level of anomalies, unlike the fourth one (CM4), which has failed at ILSS test. An industrial X-ray computed tomography (CT) has been used to scan the CM samples and a specific image processing technique has been developed to measure the number and dimension of anomalies within them. The calculated amount of anomalies seems to be within the acceptable range identified in literature, always below 5%, showing the goodness of manufacturing process, and furthermore a threshold level of 0.09 mm has been statistically calculated to discriminate between voids and the other kinds of defects.


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    Titel :

    Characterization of porosity and defects on composite materials using X-ray computed tomography and image processing


    Beteiligte:


    Erscheinungsdatum :

    2021-06-23


    Format / Umfang :

    1160215 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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