Imaging of defect density distributions in GaN was carried out. We measured transient absorption of the deep impurity levels by a 400 nm probe pulse followed by three-photon carrier pumping with an 800 nm pump pulse.
Imaging of Defect Density Distribution in GaN using Femtosecond Pump-Probe Measurement
01.01.2005
160182 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Femtosecond pump-probe reveals exciton formation
British Library Online Contents | 2000
British Library Conference Proceedings | 2001
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