Some of the impact that the test program at the Defense Electronics Supply Center (DESC) is having on improving the quality of products being supplied to its customers is illustrated. DESC test program non-mil lot rejection rates were nearing 50% for discrete semiconductors tested in receiving inspection. The associated part reject rate was nearly 15%. The part reject rate for all federal supply classes (FSCs) being sampled is less than 1%. Plans to drive the defect rate toward 100 PPM are discussed. Data indicate an increase in the quality of DESC-sampled devices being supplied for the military services over the last few years. The test programs and the sampling and test requirements are described.<>


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    DESC efforts for parts quality improvement


    Beteiligte:
    Robinson, G.R. (Autor:in) / McNicholl, B.P. (Autor:in)


    Erscheinungsdatum :

    1990-09-01


    Format / Umfang :

    355191 byte




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




    DESC Field Failure

    Lantz | Online Contents | 1993


    DESC testing program is a frontline defense for reliability

    Robinson, G.R. / McNicholl, B.P. | Tema Archiv | 1989



    TAF QUALITY IMPROVEMENT (TQI) EFFORTS IN CANADA

    Ling, A. / American Meteorological Society / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2002