By reduction of the operating current density due to a long cavity length of 900 /spl mu/m, reliable 5,000-hour operation of 680-nm window lasers has been realized under the conditions of 70 mW at 60/spl deg/C and 100 mW at 40/spl deg/C for the first time.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Reliability of 680-nm window laser diodes at 50-100 mW CW operation


    Beteiligte:
    Shima, A. (Autor:in) / Tada, H. (Autor:in) / Utakouji, T. (Autor:in) / Motoda, T. (Autor:in) / Tsugami, M. (Autor:in) / Higuchi, H. (Autor:in) / Aiga, M. (Autor:in)


    Erscheinungsdatum :

    1996-01-01


    Format / Umfang :

    164827 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Reliability of 680-nm Window Laser Diodes at 50-100mW CW Operation

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1996


    Long Term Operation Reliability of AlGaInP Visible Laser Diodes

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1994


    Reliability of low-power laser diodes

    Maurer, Richard H. / Bargeron, C. Brent / Nhan, Elbert et al. | SPIE | 1995


    Reliable 60/spl deg/c, 50 mW Operation Of 650 nm-band Window-mirror Laser Diodes

    Utakouji, T. / Shims, A. / Tada, H. et al. | IEEE | 1997


    Reliability of high-power AIGalnAs single-mode laser diodes

    Major, J.S. / Gignac, W.J. / Li, B. et al. | IEEE | 1995