The present invention relates to a sample inspection device comprising: a polarization generator; a reflector for changing a path of light emitted from the polarization generator toward a target sample; and a polarization analyzer connected rotationally through the polarization generator and a bevel gear, and the polarization analyzer receiving light reflected from the target sample.

    본 발명의 시편 검사 장치는 편광 발생기; 상기 편광 발생기로부터 방출된 광의 경로가 목표 시편을 향하도록 변경시키는 반사경; 및 상기 편광 발생기와 베벨 기어(bevel gear)를 통해 회전가능하도록 연결되고, 상기 목표 시편으로부터 반사된 광이 들어오는 편광 분석기를 포함한다.


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    Titel :

    SAMPLE INSPECTING DEVICE AND DRONE COMPRISING THE SAME


    Weitere Titelangaben:

    시편 검사 장치 및 이를 포함하는 드론


    Beteiligte:
    AN IL SIN (Autor:in) / PARK SUNG MO (Autor:in)

    Erscheinungsdatum :

    28.12.2018


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Koreanisch


    Klassifikation :

    IPC:    G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften , INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES / B64C AEROPLANES , Flugzeuge



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