To acquire a landing indicator inspection system capable of more precisely determining an abnormal landing indicator luminance.SOLUTION: A landing indicator inspection system comprises a luminance measuring device 2 to measure a luminance of a landing indicator 1, and an abnormality determination device 52 of the landing indicator to determine the luminance abnormality of the landing indicator 1 on the basis of the measured result by the luminance measuring device 2. The abnormality determination device 52 of the landing indicator compares the measured result measured in advance by the luminance measuring device 2 with the measured result newly measured by the luminance measuring device 2 and determines the luminous abnormality of the landing indicator 1.SELECTED DRAWING: Figure 1

    【課題】乗場インジケータの輝度の異常をより正確に判定することができる乗場インジケータ点検システムを得る。【解決手段】乗場インジケータ1の輝度を測定する輝度測定装置2と、輝度測定装置2の測定結果に基づいて、乗場インジケータ1の輝度の異常を判定する乗場インジケータ異常判定装置52とを備え、乗場インジケータ異常判定装置52は、予め測定された輝度測定装置2の測定結果と、新たに測定された輝度測定装置2の測定結果とを比較して、乗場インジケータ1の輝度の異常を判定する。【選択図】図1


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    Titel :

    LANDING INDICATOR INSPECTION SYSTEM


    Weitere Titelangaben:

    乗場インジケータ点検システム


    Beteiligte:
    WATABE YUKI (Autor:in)

    Erscheinungsdatum :

    2019-12-12


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Japanisch


    Klassifikation :

    IPC:    B66B Aufzüge , ELEVATORS



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