A multi-reflecting time of flight mass analyser is disclosed in which the ion flight path is maintained relatively small and the duty cycle is made relatively high. Spatial focusing of the ions in the dimension (z-dimension) in which the mirrors (36) are elongated can be eliminated whilst maintaining a reasonably high sensitivity and resolution.


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    Titel :

    Multi-reflecting time of flight mass spectrometers


    Erscheinungsdatum :

    21.06.2017


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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