A sampling method according to one aspect of the present invention includes: obtaining topographical information about a predetermined wide area by using a first sensor provided on a work machine; selecting a candidate area within the wide area based on the topographical information about the wide area, the candidate area having an area less than an area of the wide area, and setting a movement route based on the topographical information about the wide area, the movement route being a route that allows a distal end portion of an arm provided on the work machine to reach a preparation position without coming into contact with an obstacle, the preparation position being located above the candidate area; moving the distal end portion of the arm along the movement route to the preparation position, and thereafter obtaining topographical information about the candidate area by using a second sensor provided on the distal end portion of the arm; and specifying a sampling point based on the topographical information about the candidate area and performing sampling at the specified sampling point.


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    Titel :

    SAMPLING METHOD AND SAMPLING SYSTEM


    Weitere Titelangaben:

    ABTASTVERFAHREN UND ABTASTSYSTEM
    PROCÉDÉ D'ÉCHANTILLONNAGE ET SYSTÈME D'ÉCHANTILLONNAGE


    Beteiligte:

    Erscheinungsdatum :

    2022-01-26


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    B64G Raumfahrt , COSMONAUTICS / G06V



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