The invention relates to an active spectral imaging system and method for insulator pollution degree grading, and the system comprises a parameter-adjustable halogen pulse light source, a power supply, a short-wave infrared imaging unit, a control unit, and an image processing unit, the control unit, the power supply, and the parameter-adjustable halogen pulse light source are connected in sequence, and the image processing unit is connected with the power supply. The short wave infrared imaging unit is connected with the image processing unit and the control unit. According to the invention, an active light source is used to irradiate and heat the insulator, and then the short wave infrared imaging technology is used to continuously photograph the surface of the irradiated insulator. Due to the fact that the thermal change rates of the insulators with different contamination degrees after irradiation are obviously different, the contamination degrees can be judged by analyzing the thermal change rates, and then visual analysis of the contamination degrees is achieved.

    本发明涉及一种用于绝缘子污秽程度分级的主动光谱成像系统及方法,包括参数可调卤素脉冲光源、电源、短波红外成像单元、控制单元和图像处理单元,其中,控制单元、电源和参数可调卤素脉冲光源依次连接,短波红外成像单元分别连接图像处理单元和控制单元。本发明利用主动光源对绝缘子进行辐照加热,然后采用短波红外成像技术对辐照后的绝缘子表面进行连续拍照。由于不同污秽程度的绝缘子在辐照后的热变化率存在显著差异,通过分析这些热变化率可以判定污秽程度,进而实现污秽程度的可视化分析。


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    Titel :

    Active spectral imaging system and method for insulator pollution degree grading


    Weitere Titelangaben:

    一种用于绝缘子污秽程度分级的主动光谱成像系统及方法


    Beteiligte:
    GUO WEI (Autor:in) / ZHOU CHENXI (Autor:in) / WANG YANGMING (Autor:in) / WU YIBO (Autor:in) / WEN QINGFENG (Autor:in) / LI LONGJI (Autor:in) / ZHANG CHI (Autor:in) / WANG SONGBO (Autor:in) / LI XUEGANG (Autor:in)

    Erscheinungsdatum :

    10.01.2025


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Chinesisch


    Klassifikation :

    IPC:    B64U / G01R Messen elektrischer Größen , MEASURING ELECTRIC VARIABLES / G01J Messen der Intensität, der Geschwindigkeit, der spektralen Zusammensetzung, der Polarisation, der Phase oder der Pulscharakteristik von infrarotem, sichtbarem oder ultraviolettem Licht , MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT



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