The method includes a measurement step and a separate alignment step. Alignment of the guide rail (25) supported with an adjustable fastening member (50) in the hoistway (20) is measured at several measurement points along the height of the guide rail line based on at least one reference line (PL1, PL2) provided near the guide rail. The measurement results are stored in a memory. The rails are aligned based on measurements stored in the memory. The alignment step is performed after the measurement results of all the measurement points have been stored in the memory.

    该方法包括测量步骤和单独的对齐步骤。利用井道(20)中的可调整紧固部件(50)支撑的导轨(25)的对齐基于提供在导轨附近的至少一条参考线(PL1、PL2)在沿着导轨线的高度的若干测量点处被测量。测量结果被存储到存储器中。导轨基于存储器中存储的测量结果被对齐。对齐步骤在所有测量点的测量结果都已被存储在存储器中之后被执行。


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    Method and device for aligning elevator guide rails


    Weitere Titelangaben:

    用于对齐电梯导轨的方法和装置


    Beteiligte:
    MAKINEN HARRI (Autor:in) / HAAG MONICA (Autor:in) / JOKELA JARMO (Autor:in) / HAIVALA MARKKU (Autor:in)

    Erscheinungsdatum :

    05.01.2024


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Chinesisch


    Klassifikation :

    IPC:    B66B Aufzüge , ELEVATORS



    METHOD FOR ALIGNING GUIDE RAILS OF AN ELEVATOR

    HAAG MIKAEL / MAKINEN HARRI / HAIVALA MARKKU et al. | Europäisches Patentamt | 2023

    Freier Zugriff

    Method and an arrangement for aligning elevator guide rails

    MAKINEN HARRI / HAAG MIKAEL / MALMIALA VILLE et al. | Europäisches Patentamt | 2025

    Freier Zugriff

    A METHOD FOR ALIGNING GUIDE RAILS OF AN ELEVATOR

    HAAG MIKAEL / MÄKINEN HARRI / JOKELA JOONAS et al. | Europäisches Patentamt | 2023

    Freier Zugriff

    METHOD AND AN ARRANGEMENT FOR ALIGNING ELEVATOR GUIDE RAILS

    MAKINEN HARRI / HAAG MIKAEL / MALMIALA VILLE et al. | Europäisches Patentamt | 2024

    Freier Zugriff

    A METHOD FOR ALIGNING GUIDE RAILS OF AN ELEVATOR

    HAAG MIKAEL / MÄKINEN HARRI / JOKELA JOONAS et al. | Europäisches Patentamt | 2022

    Freier Zugriff