The invention relates to a testing jig for rail-mounted equipment testing. The testing jig comprises a support structure, wherein guide rails extending longitudinally are fixedly connected to the support structure; lifting cars which are in rolling contact with the guide rails and are used for mounting to-be-detected pieces are further included; lifting mounting frames used for mounting the to-be-detected pieces are fixedly connected to the lifting cars, inspection encoders are connected to the lifting mounting frames, and steel wire ropes arranged corresponding to the inspection encoders areconnected to the support structure; and a lifting driving device used for driving the lifting mounting frames and the lifting cars to synchronously lift along the guide rails is further included, andthe lifting driving device can drive the lifting mounting frames to lift at different speeds. According to the testing jig, two kinds of safety locks can be detected without purchasing two sets of detection equipment, so that the universality of the testing jig is improved, and the purchasing cost of a manufacturer is reduced.

    本发明涉及一种用于轨道式设备试验的测试架。包括支架结构,在支架结构上固接有纵向延伸的导轨;还包括与导轨滚动接触的用以安装待检测件的升降车;在升降车上固接有用以安装待检测件的升降安装架,在升降安装架上连接有检验编码器,在支架结构上连接有与检验编码器对应设置的钢丝绳;还包括用于驱动升降安装架和升降车沿导轨同步升降的升降驱动装置,升降驱动装置可驱动升降安装架以不同的速度升降。本发明可对两种安全锁具进行检测,无需购置两套检测设备,提高了设备的通用性,降低了厂家的采购成本。


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    Titel :

    Testing jig for rail-mounted equipment testing


    Weitere Titelangaben:

    一种用于轨道式设备试验的测试架


    Beteiligte:
    YU CHUNSHENG (Autor:in)

    Erscheinungsdatum :

    2021-02-19


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Chinesisch


    Klassifikation :

    IPC:    B66B Aufzüge , ELEVATORS



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