The invention provides a satellite on-orbit embedded type test system, and belongs to the technical field of satellite tests. The satellite on-orbit embedded type test system solves the problem that the test time is long in an existing satellite on-orbit test. The satellite on-orbit embedded type test system is characterized in that after a satellite is launched into an orbit and enters an on-orbit test mode, firstly, a checking module of a flight program execution result is executed, if the flight program execution result is normal, then the checking module of an equipment state is executed, otherwise the satellite enters into a safe mode from a test mode; if the checking module of the equipment state is normal in checking the equipment state, an establishing module of a work state is executed, otherwise a failure processing module of equipment is executed; if the establishing module of the work state is normal in establishing the work state, the checking module of a mission execution result is executed, otherwise the satellite enters into the safe mode from the test mode; if the checking module of the mission execution result is normal in the checking result, then the on-orbit test is over, otherwise the satellite enters into the safe mode from the test mode. The satellite on-orbit embedded type test system is mainly applied to a quick test after the satellite enters into the orbit.


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    Titel :

    Satellite on-orbit embedded type test system


    Beteiligte:
    LI HUAYI (Autor:in) / CAO XIBIN (Autor:in) / CHEN JIAN (Autor:in) / LI DONGBAI (Autor:in) / WANG FENG (Autor:in) / ZHANG JIAN (Autor:in) / SUN ZHAOWEI (Autor:in) / XU GUODONG (Autor:in) / GENG YUNHAI (Autor:in) / SHEN XUCHEN (Autor:in)

    Erscheinungsdatum :

    06.05.2015


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    B64G Raumfahrt , COSMONAUTICS



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