The invention relates to a non-contact type escalator multi-parameter measuring method based on a photoelectricity testing part, and belongs to the technical field of optical measurement. The method comprises the following steps that (1), a light source is started to light up an escalator; (2), the escalator reflects light rays to be transmitted to the photoelectricity testing part, and the moving track of the escalator can be recorded as a set of coherent image which is shot at high speed; and an image signal is output, and is fed into an A/D conversion module to be converted; (3), a conversion result is fed into an image processing module to be processed, and the image signal is compared with an image stored in the previous sampling period; (4), if a sampling point moves between a front image and a rear image, displacement signals in the longitudinal direction and the transverse direction are sent to a single chip microcomputer system so as to judge the moving direction and displacement of a measured object; and or, sampling of the next period is continuously carried out; and (5), a judgment result is transmitted to a monitoring terminal so as to achieve real-time monitoring and control of the escalator. The method is adopted to carry out measuring, and is not in direct contact with a measured object, and the problems of friction and pressure exertion on the measured object do not exist in measurement; and errors cannot be generated by abrasion, and dynamic measuring of the measured object can be achieved.


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    Titel :

    Non-contact type escalator multi-parameter measuring method based on photoelectricity testing part


    Beteiligte:
    WEI BIAO (Autor:in) / TANG YUAN (Autor:in) / LIU CHAOYANG (Autor:in) / WU DECAO (Autor:in) / MI DELING (Autor:in)

    Erscheinungsdatum :

    2015-04-22


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    B66B Aufzüge , ELEVATORS



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