Age effects on symbol recognition
R. W. Allen, Z. Parseghian, and P.G. Van-Valkenburgh, Systems Technology Inc., Hawthorne, CA. NTIS No. DOT-FH-11-9497
Journal of Safety Research ; 13 , 4 ; 177
01.01.1983
1 pages
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
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