Abstract Outdoor X-band scatterometer data acquired over a prepared test-site near the Department of Electronics Engineering, Banaras Hindu University, Varanasi, were analyzed to determine the spinach field identification accuracies obtainable using bistatic multidate scatterometer data. The collected data were used to compute normalized radar-cross section (σ 0), and brightness temperature (TB) at frequency 9.79 GHz. The dependence of these parameters on look angle, polarization and moisture content are computed. Observations were taken on several dates corresponding to growth stages of spinach, which seems to affect greatly the above mentioned parameters. However, the nature of variation is consistent. Therefore, the level of accuracy in determining a crop-type is greatly enhanced.


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    Titel :

    Monitoring of spinach by microwave remote sensing at X-band


    Beteiligte:
    Sharma, S.K. (Autor:in) / Singh, K.P. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.01.1992


    Format / Umfang :

    4 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch