Two- and three-dimensional vision systems for inspection, control, and metrology : 29 - 30 October 2003, Providence, Rhode Island, USA
Conference ; 2003 ; Providence, RI Conference (Providence, RI) : 2003.10.29-30
2004
V, 214 S
Langzeitarchivierung durch Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek
Konferenzband
Englisch
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