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    Titel :

    Machine vision applications in industrial inspection VIII : 24 - 26 January 1999, San Jose, California



    Kongress:

    SPIE Conference on Machine Vision Applications in Industrial Inspection ; 8 ; 2000 ; San Jose, Calif. SPIE Conference on Machine Vision Applications in Industrial Inspection ; 8 (San Jose, Calif.) : 2000.01.24-26


    Erscheinungsdatum :

    2000


    Format / Umfang :

    IX, 396 S


    Anmerkungen:

    Langzeitarchivierung durch Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek



    Medientyp :

    Konferenzband


    Format :

    Print


    Sprache :

    Englisch



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