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    Titel :

    X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : 9 - 13 July 1990, San Diego, Calif.



    Kongress:

    X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography ; 1990 ; San Diego/Calif. X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography (San Diego/Calif.) : 1990.07.08-13
    International Symposium on Optical and Optoelectronic Applied Science and Engineering ^[Part] ; 1990 ; San Diego
    International Symposium on Optical and Optoelectronic Applied Science and Engineering ^[Part] (San Diego) : 1990.07.08-13


    Erschienen in:

    Erscheinungsdatum :

    1991


    Format / Umfang :

    XII, 579 S.


    Anmerkungen:

    Ill., graph. Darst.
    Part of a three-conference program on X-Ray and EUV Technologies held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, in San Diego, California"--P. x
    Includes bibliographical references and index



    Medientyp :

    Konferenzband


    Format :

    Print


    Sprache :

    Englisch



    Klassifikation :

    DDC:    621.36