X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : 9 - 13 July 1990, San Diego, Calif.
X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography
;
1990
;
San Diego/Calif.
X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography (San Diego/Calif.) : 1990.07.08-13
International Symposium on Optical and Optoelectronic Applied Science and Engineering ^[Part]
;
1990
;
San Diego
International Symposium on Optical and Optoelectronic Applied Science and Engineering ^[Part] (San Diego) : 1990.07.08-13
Proceedings / SPIE ; 1343
1991
XII, 579 S.
Ill., graph. Darst.
Part of a three-conference program on X-Ray and EUV Technologies held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, in San Diego, California"--P. x
Includes bibliographical references and index
Konferenzband
Englisch
DDC: | 621.36 |
16th annual safe sympos., proc., San Diego, Calif., Oct. 8-12, 1978
Tema Archiv | 1979
Bulkhead and pier for the new port of San Diego, Calif
Engineering Index Backfile | 1913