Fabrication, testing, and reliability of semiconductor lasers II : 13 - 14 February, 1997, San José, California
Conference ; 1997 ; San Jose, Calif. Conference (San Jose, Calif.) : 1997.02.13-14
Proceedings / SPIE ; 3004
1997
V, 176 S.
Ill., graph. Darst.
Includes bibliographic references and author index
Konferenzband
Englisch
DDC: | 621.36/6 |