Model Results on the Radiation-Hardness of Submicron Electronics in Aeronautical Systems
US Air Force T&E Days Conference ; 2010 ; Nashville, TN
01.01.2010
7 pages
Includes bibliographical references and index
Aufsatz (Konferenz)
Englisch
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Nuclear Hardness Assurance for Aeronautical Systems
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NTRS | 1957
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Engineering Index Backfile | 1947
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Engineering Index Backfile | 1947