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    Titel :

    MICROPLASMA ELECTRON NUMBER DENSITY MEASUREMENT BY RESONANT COHERENT MICROWAVE RAYLEIGH SCATTERING



    Kongress:

    48th, Aerospace sciences meeting; 48th AIAA Aerospace Sciences Meeting including the New Horizons Forum and Aerospace Exposition ; 2010 ; Orlando, FL



    Erscheinungsdatum :

    01.01.2010


    Format / Umfang :

    12 pages


    Anmerkungen:

    Includes bibliographical references and index; Also contains papers from the New Horizons Forum and Aerospace Exhibit 2009



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch






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