Optical constants determination of an anisotropic thin film by attenuated total reflection method analyzed by sensitivity calculation
5th, Pacific Rim conference on lasers and electro-optics; photonics lights innovation: from nano-structures and devices to systems and networks ; 2003 ; Taipei, Taiwan
2003-01-01
606 pages
Includes bibliographic references and author index
Aufsatz (Konferenz)
Englisch
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