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    Titel :

    Modulation-amplitude-locked laser diode interferometry for distance measurement [5265-17]



    Kongress:

    Conference, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology ; 2003 ; Providence, R.I



    Erscheinungsdatum :

    01.01.2004


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Stroboscopic step height measurement with two-wavelength interferometer using a single diode laser source [5265-18]

    Zhao, X. / Suzuki, T. / Sasaki, O. et al. | British Library Conference Proceedings | 2004


    Applied multifocus 3D microscopy [5265-19]

    Zamofing, T. / Hugli, H. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    3D precision surface measurement by dynamic structured light [5265-04]

    Franke, E. A. / Magee, M. J. / Mitchell, J. N. et al. | British Library Conference Proceedings | 2004


    2D packing using the Myriad framework [5265-27]

    Chatburn, L. T. / Batchelor, B. G. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Amplitude modulation on frequency-locked-extended-cavity diode lasers [2378-06]

    Fox, R. W. / D'Evelyn, L. / Robinson, H. G. et al. | British Library Conference Proceedings | 1995