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    Titel :

    3D precision surface measurement by dynamic structured light [5265-04]



    Kongress:

    Conference, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology ; 2003 ; Providence, R.I



    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    9 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Applied multifocus 3D microscopy [5265-19]

    Zamofing, T. / Hugli, H. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Specular-reflection-based flatness tester [5265-13]

    Tang, S.-G. / Harding, K. G. / O Neil, G. et al. | British Library Conference Proceedings | 2004


    Modulation-amplitude-locked laser diode interferometry for distance measurement [5265-17]

    Suzuki, T. / Iwana, T. / Sasaki, O. et al. | British Library Conference Proceedings | 2004


    2D packing using the Myriad framework [5265-27]

    Chatburn, L. T. / Batchelor, B. G. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Volume holographic imaging for surface metrology with long working distances [5265-10]

    Sinha, A. / Sun, W. / Shih, T. et al. | British Library Conference Proceedings | 2004