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    Titel :

    Noise measurements of HgCdTe LWIR arrays with CCD readouts [4795-24]



    Kongress:

    Conference; 2nd, Materials for infrared detectors ; 2002 ; Seattle, WA



    Erscheinungsdatum :

    2002-01-01


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    2x64 linear LWIR arrays based in HgCdTe MBE-grown layers and CCD silicon readouts [4355-07]

    Vasilyev, V. V. / Dvoretsky, S. A. / Esaev, D. G. et al. | British Library Conference Proceedings | 2001


    Optical and electronic characterization on HgCdTe materials [4795-11]

    Chu, J. H. / Chang, Y. / Huang, Z. M. et al. | British Library Conference Proceedings | 2002


    Progress in MBE growth of HgCdTe at SITP [4795-05]

    He, L. / Wu, Y. / Chen, L. et al. | British Library Conference Proceedings | 2002


    MBE growth of HgCdTe HOT detector heterostructures [4795-16]

    Zhao, J. / Zhou, Y. D. / Badano, G. et al. | British Library Conference Proceedings | 2002


    Minority carrier lifetime in abrupt MBE-grown HgCdTe heterostructures [4795-37]

    Sewell, R. / Dell, J. M. / Musca, C. A. et al. | British Library Conference Proceedings | 2002