Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Surface profile measurement of specular objects by grating projection method [4567-11]



    Kongress:

    Conference, Machine vision and three dimensional imaging systems for inspection and metrology ; 2001 ; Newton, MA



    Erscheinungsdatum :

    01.01.2002


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


    Automated optimization of measurement setups for the inspection of specular surfaces [4567-34]

    Kammel, S. / SPIE | British Library Conference Proceedings | 2002


    Nr. 4567

    DataCite | 1933


    Structured lighting method using moire pattern projection [4567-10]

    Yoshizawa, T. / Yamaguchi, T. / Takahashi, H. et al. | British Library Conference Proceedings | 2002


    Simulation process for the design and optimization of a machine vision system for specular surface inspection [4567-25]

    Seulin, R. / Bonnot, N. / Merienne, F. et al. | British Library Conference Proceedings | 2002


    Actual profile reconstruction of a precision cylinder based on error separation technique [4567-16]

    Li, J. / Zhang, L. / Ni, Z. et al. | British Library Conference Proceedings | 2002