Switching property of sol-gel vanadium oxide thin films [4596-04]
Conference; 2nd, Advanced photonic sensors and applications ; 2000 ; Singapore
2001-01-01
6 pages
Aufsatz (Konferenz)
Englisch
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DataCite | 1933
Thin films residual stress measurement by optical profilometry [4596-02]
British Library Conference Proceedings | 2001
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