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    Titel :

    Evaluation of crystal lattice imperfections using reflection x-ray microscope [4501-11]



    Kongress:

    Conference; 2nd, X-ray mirrors, crystals, and multilayers ; 2001 ; San Diego, CA



    Erscheinungsdatum :

    01.01.2001


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nr. 4501

    DataCite | 1931


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    Development of a thin substrate for x-ray telescope [4501-08]

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