Stitching interferometry for the wavefront metrology of x-ray mirrors [4501-07]
Conference; 2nd, X-ray mirrors, crystals, and multilayers ; 2001 ; San Diego, CA
2001-01-01
5 pages
Aufsatz (Konferenz)
Englisch
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DataCite | 1931
Stitching Interferometry: A Flexible Solution for Surface Metrology
British Library Online Contents | 2003
|La/B~4C multilayer mirrors for x-rays below 190 eV [4501-16]
British Library Conference Proceedings | 2001
|Surface quality of x-ray mirrors evaluated at the advanced photon source [4501-05]
British Library Conference Proceedings | 2001
|Influence of deposition parameters on the reflectivity of multilayer hard x-ray mirrors [4501-17]
British Library Conference Proceedings | 2001
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