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    Titel :

    Measurement of spatial coherence of a superluminescent diode using an interferometer with double slit [4416-89]



    Kongress:

    International conference, Optical engineering for sensing and nanotechnology ; 2001 ; Yokohama, Japan



    Erscheinungsdatum :

    2001-01-01


    Format / Umfang :

    4 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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