A Quasi-Two Dimensional Model for Fully Depleted Single Gate SOI MOSFETs Including Temperature Effects
National aerospace and electronics conference; NAECON 2000 ; 2000 ; Dayton, OH
01.01.2000
8 pages
IEEE cat no 00CH37093
Aufsatz (Konferenz)
Englisch
NAECON , IEEE , electronics , aerospace
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