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    Titel :

    Structural perfection diagnostics of narrow-gap photosensitive semiconductor junctions by electron diffraction [4340-37]



    Kongress:

    International conference; 16th, Photoelectronics and night-vision devices ; 2000 ; Moscow



    Erscheinungsdatum :

    2000-01-01


    Format / Umfang :

    3 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Infrared dual-magnification telescope using diffraction optics [4340-24]

    Kerget, I. V. / Korneychik, V. L. / Kudryashov, A. A. et al. | British Library Conference Proceedings | 2000


    Nr. 4340

    DataCite | 1928


    Suppression of the impact ionization by secondary carriers in avalanche photosensitive MIS-like structures [4340-26]

    Burbaev, T. M. / Kurbatov, V. A. / Kurochkin, N. E. et al. | British Library Conference Proceedings | 2000


    Femtosecond photoelectronics [4340-25]

    Prokhorov, A. M. / Schelev, M. Y. / Russian Federation RD & P Centre ORION | British Library Conference Proceedings | 2000


    Metastable behavior of current-voltage characteristics in Hg~1~-~xCd~xTe p-n junctions [4340-14]

    Soltanovich, O. A. / Yakimov, E. B. / Yarykin, N. A. et al. | British Library Conference Proceedings | 2000