Photoluminescence characterization of Er^3^+-implanted silica thin films containing Si nanocrystals [3942-11]
Conference; 4th, Rare-earth-doped materials and devices ; 2000 ; San Jose, CA
01.01.2000
9 pages
Aufsatz (Konferenz)
Englisch
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|Waveguided Raman and Brillouin scattering [3942-15]
British Library Conference Proceedings | 2000
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