C-Ni multilayer reflectors: an AFM roughness study
Symposium; 6th, Optoelectronics ; 1999 ; Bucharest
01.01.2000
7 pages
. Also known as SIOEL '99
Aufsatz (Konferenz)
Englisch
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SAE | 1989
SAE | 1977
Engineering Index Backfile | 1952
SAE | 1995