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    Titel :

    Analyses of light diffracted on rough surfaces to measure in-plane displacements using a heterodyne interferometer [3478-23]



    Kongress:

    Conference; 9th, Laser interferometry: applications ; 1998 ; San Diego; CA



    Erscheinungsdatum :

    1998-01-01


    Format / Umfang :

    11 pages



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Heterodyne interferometer with frequency-modulated laser diodes for in- and out-of-plane measurements of vibrations [3478-27]

    Drabarek, P. / Van Keulen, M. / Steinlechner, S. et al. | British Library Conference Proceedings | 1998


    Nr. 3478

    DataCite | 1912


    Precise measurement of nonoptical surfaces by an oblique incidence interferometer [3478-20]

    Otani, Y. / Kuwahara, T. / Yamamoto, M. et al. | British Library Conference Proceedings | 1998


    Direct group-delay measurement and 3D profilometry using a white-light interferometer [3478-06]

    Liang, Y. / Wu, Q. M. J. / Grover, C. P. et al. | British Library Conference Proceedings | 1998


    Fourier transform moire deflectometry [3478-42]

    Wang, M. / Li, D. / Zhong, J. et al. | British Library Conference Proceedings | 1998