Ellipsometry and Raman spectroscopy of MBE-grown undoped Si-Si~0~.~7~8Ge~0~.~2~2/(001)Si superlattices [3182-31]
Conference, Material science and material properties for infrared optoelectronics ; 1996 ; Uzhgorod; Ukraine
1997-01-01
7 pages
Aufsatz (Konferenz)
Englisch
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