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    Titel :

    Actively phase-compensated portable fiber optic electronic speckle pattern interferometer (ESPI) for long-term in-situ measurements [2860-17]



    Kongress:

    Conference; 8th, Laser interferometry VIII: techniques and analysis ; 1996 ; Denver; CO



    Erscheinungsdatum :

    01.01.1996


    Format / Umfang :

    6 pages


    Anmerkungen:

    See also same shelfmark vol 2861 1996 for further papers




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Modified in-plane electronic speckle pattern shearing interferometry (ESPSI) [2860-28]

    Patorski, K. / Olszak, A. G. / SPIE | British Library Conference Proceedings | 1996


    Surface profile determination by additive-subtractive phase-modulated ESPI with Fourier analysis [2860-19]

    Wang, L.-S. / Krishnaswamy, S. / SPIE | British Library Conference Proceedings | 1996


    Double shear speckle interferometry for curvature measurement [2860-21]

    Ganesan, A. R. / Murukeshan, V. M. / Meinlschmidt, P. et al. | British Library Conference Proceedings | 1996


    Investigation of speckle displacement effects on speckle interferometry [2860-47]

    Song, Y. / Wu, Y. / Kulenovic, R. et al. | British Library Conference Proceedings | 1996


    Infrared interferometer for optical testing [2860-24]

    Freischlad, K. R. / Cote, J. / SPIE | British Library Conference Proceedings | 1996