Express method for optical strength diagnostics in transparent dielectrics and semiconductors [2113-26]
International workshop, Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 1993 ; Kiev
Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 2113 ; 164-168
1994-01-01
5 pages
Aufsatz (Konferenz)
Englisch
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