Response Analysis of a Photon-Counting Device (IPD) for Speckle Techniques
2nd Conference, High-resolution imaging by interfometry: ground-based interferometry at visible and infrared wavelengths ; 1991 ; Garching; Germany
High-resolution imaging by interfometry: ground-based interferometry at visible and infrared wavelengths ; 39//pt 1 ; 621-628
ESO CONFERENCE AND WORKSHOP PROCEEDINGS ; 39//pt 1
1992-01-01
8 pages
In 2 pts
Aufsatz (Konferenz)
Englisch
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