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    Titel :

    Phase shifting in shearing interferometry with double-frequency grating and semiconductor laser to measure temperature field [2321-79]



    Kongress:

    2nd International conference, Optoelectronic science and engineering '94 ; 1994 ; Beijing



    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    3 pages


    Anmerkungen:

    Also known as ICOESE '94




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]

    Steinchen, W. / Yang, L. X. / Schuth, M. et al. | British Library Conference Proceedings | 1994


    Nr. 2321

    DataCite | 1888


    Double heterodyne interferometer using a multimode laser diode [2321-220]

    Han, S. / Dalhoff, E. / Fischer, E. et al. | British Library Conference Proceedings | 1994


    Fabrication of waveguide grating coupler with double corrugation by ion-beam etching technology [2321-127]

    Li, Y. J. / Xu, M. / Parriaux, O. M. et al. | British Library Conference Proceedings | 1994


    Self-reference single-plate shearing interferometric technique and its application [2321-61]

    Zhao, M. / Li, G. / Zhang, J. et al. | British Library Conference Proceedings | 1994