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    Titel :

    Measurement error caused by white-light spectrum in fringe scanning interferometry [2321-60]



    Kongress:

    2nd International conference, Optoelectronic science and engineering '94 ; 1994 ; Beijing



    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    3 pages


    Anmerkungen:

    Also known as ICOESE '94




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Misalignment-induced fringe beating effects in a white-light interferometer [2321-63]

    Palmer, A. W. / Ning, Y. N. / Grattan, K. T. V. et al. | British Library Conference Proceedings | 1994


    Nr. 2321

    DataCite | 1888


    Nr. 2321

    DataCite | 1890


    Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]

    Steinchen, W. / Yang, L. X. / Schuth, M. et al. | British Library Conference Proceedings | 1994


    Spatial light modulators and applications (Invited Paper) [2321-187]

    Suzuki, Y. / Chinese Optical Society; Topical Committee on Optoelectronic Technology / SPIE- The International Society for Optical Engineering | British Library Conference Proceedings | 1994