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    Titel :

    Feature Extraction and Feature Selection of Microwave Scattering Images



    Kongress:

    National aerospace and electronics conference ; 1994 ; Dayton; OH



    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    5 pages


    Anmerkungen:

    In 2 vols; Theme title: Technology for a global market. Also known as NAECON 1994. IEEE Cat no 94CH3431-4; See also 4362.78768 vol 9 no 9 1994 for selected reports




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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