Addresses the importance of designing reliability and maintainability (R&M) into electronic equipment in the early stages of its development. The author describes an approach called the avionics/electronics integrity program (AVIP), which emphasizes early attention to design criteria and analysis, and dictates a process which strikes a balance between analysis and test. He outlines some of the problems and limitations that have been observed using the traditional reliability approach (MIL-STD-785 process) and discusses how the AVIP approach will overcome these problems and limitations. AVIP retains and incorporates the proven and useful elements of the traditional reliability approach, such as failure modes; effects and criticality analysis (FMECA); failure reporting analysis and corrective action system (FRACAS); and environmental stress screening (ESS).


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    R&M through avionics/electronics integrity program


    Additional title:

    Die Beruecksichtigung von Zuverlaessigkeit und Wartungsmoeglichkeit in der Avionik und Elektronik beim Entwurf


    Contributors:


    Publication date :

    1989


    Size :

    5 Seiten, 10 Quellen


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





    Avionics integrity program : Papers

    IEEE Dayton Section / Dayton Chapter, IEEE Aerospace and Electronic Systems Society | TIBKAT | 1988


    The Avionics Integrity Program

    Chou, George C. | SAE Technical Papers | 1988